The CogIDProcessControlMetricsSEMIT10 type exposes the following members.
Properties
| Name | Description | |
|---|---|---|
| AxialNonUniformity |
Two-dimensional matrix symbols include data fields of modules
nominally lying in a regular polygonal grid, and any reference decode
algorithm must adaptively map the center positions of those modules to
extract the data. Axial Nonuniformity tests for uneven scaling of the
symbol which would hinder readability at some non-normal viewing
angles more than at others.
This is a measure of how much the sampling point spacing differs between the X and Y axes.A value of 0 means there is no difference. | |
| CellDefects |
Ratio of incorrect pixels to total pixels in the Data Matrix data grid.
| |
| DataMatrixCellHeight |
The Data Matrix Cell Size expresses the average height of each cell in
the matrix in pixels.
| |
| DataMatrixCellWidth |
The Data Matrix Cell Size expresses the average width of each cell in
the matrix in pixels.
| |
| FinderPatternDefects |
Ratio of incorrect pixels to total pixels in the Data Matrix finder
pattern.
| |
| HorizontalMarkGrowth |
Mark Growth is concerned with tracking the tendency of a marking
system to over or under mark the symbol. This is a size comparison
between the actual marked cells vs. their nominal size.
| |
| HorizontalMarkMisplacement |
Data Matrix Mark Misplacement measures the average misplacement of
Data Matrix marks from their respective ideal Data Matrix Cell Center
Points.
| |
| PrintGrowth |
Print Growth tests that the graphical features comprising the symbol
have not grown or shrunk from nominal so much as to hinder readability
with less favorable imaging conditions than the test condition.
| |
| SignalToNoiseRatio |
The Symbol Contrast Signal to Noise Ratio (SNR) is a relative measure
of the symbol contrast (signal) to the maximum deviation in the light
or dark grayscale level in the symbol (noise).
| |
| SymbolContrast |
Symbol Contrast measures the distinctiveness of the two reflective
states in the symbol, namely light and dark. Many aspects of the
mark/reader configuration affect the resulting symbol contrast in the
image.
Range is 0.0 (no contrast) to 1.0 (full contrast). | |
| UEC |
Percentage of unused error correction capacity.
The higher the unused error correction capacity, the better the symbol quality. Ranges from 0 (all error correction capacity used) to 1.0 (no error correction capacity used). | |
| VerticalMarkGrowth |
Mark Growth is concerned with tracking the tendency of a marking
system to over or under mark the symbol. This is a size comparison
between the actual marked cells vs. their nominal size.
| |
| VerticalMarkMisplacement |
Data Matrix Mark Misplacement measures the average misplacement of
Data Matrix marks from their respective ideal Data Matrix Cell Center
Points.
|
See Also