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# What data does Event History collect and display?

Event History combines statistic and code quality data acquisition in a real-time graph, depending on the setting in the top left under Settings > Plotted Value. RTM Lean monitors the selected value on the device. For code quality metrics and grades, only the code quality standard that is set on the monitored device is available under Plotted Value. You can collect data for another standard by changing the enabled code quality standard on the target device.

The scrollbar can be moved to the desired point in time to view the data of that particular time. Scrollbar length can be modified (hold click and drag) to change the monitored interval. An aggregated value of the plotted value of the selected time period (by positioning the scrollbar) is displayed in the top middle under Aggregated value in selected period.

Data collection populates the bottom line of the graph with dots that represent events during monitoring. Each event is listed on the right side with details (time stamp and event type). There are two buttons below the list:

- Save Device Backups allows you to export the device config tied to the selected event on the list. This might be used to check for details when looking for reasons for a change in a given statistic, metric or grade.

- Compare Configurations opens up the document where you can compare the device configurations tied to the selected events; this only works if more than one event is selected from the list.

Note: DM060,DM260,DM300,DM360,DM503, DM370,DM280, DM470, RTM_Lean